X-ray inspection method and x-ray inspection apparatus
AssigneeShimadzu Corporation
InventorsNaoki MORIMOTO, Kenji TAKUBO, Zhimin Xie, Zezheng Chen
Life of this patent
Estimating the term…
Loading patent…
AssigneeShimadzu Corporation
InventorsNaoki MORIMOTO, Kenji TAKUBO, Zhimin Xie, Zezheng Chen
Estimating the term…
An X-ray inspection method comprises: an X-ray transmission image acquisition step of performing X-ray imaging of an object 1 to acquire a two-dimensional X-ray transmission image 3a; a model generation step of generating a model corresponding to the object 1 including a defect 2 as a three-dimensional virtual model 4, using a known structural parameter for the object 1; a virtual transmission image generation step of generating a two-dimensional virtual transmission image 6a from the three-dimensional virtual model; and a parameter modification step of modifying a structural parameter of the three-dimensional virtual model 4 so as to make the two-dimensional virtual transmission image 6a closer to the two-dimensional X-ray transmission image 3a, using a comparison result between the two-dimensional X-ray transmission image 3a and the two-dimensional virtual transmission image 6a.
An X-ray inspection method, comprising:
An X-ray inspection apparatus, comprising:
Dependencies are inferred from the claim text.