Test and/or measurement system, computer-implemented method of gathering data of a signal and computer program product

Abstract

The present disclosure relates to a test and/or measurement system having a processing circuit configured to process a signal and to determine at least a first presentation based on a first parameter and a second presentation based on a second parameter when processing the signal, wherein the second parameter is different to the first parameter. The test and/or measurement system includes a display connected with the processing circuit, which is configured to display either the first presentation or the second presentation at the same time. The test and/or measurement system includes a storage medium configured to store first data associated with the first presentation and second data associated with the second presentation. Further, a computer-implemented method of gathering data of a signal as well as a computer program product are described.

Dependencies are inferred from the claim text.