Electrical measurement methods, systems, and kits

An electrical testing method, comprising:

• using a first electrical device to detect at least two parameters of an electrical system, the first electrical device including:
• a probe element that is configured to be placed into contact with the electrical system and provide an input signal thereto;
• a processor electrically connected to the conducting probe element and configured to (a) manipulate the input signal provided to the electrical system, and (b) receive an output signal representative of one or more parameters of the at least two parameters of the electrical system;
• using a second electrical device to (i) preserve memory settings of the electrical system, and (ii) derive any parasitic draw within the electrical system;
• using a third electrical device to derive amperage of an electrical element of the electrical system, the deriving determining voltage drop across an in-circuit electrical path passing through the electrical element and accessing impedance data of the electrical element to calculate from the voltage drop and the impedance data amperage of the electrical element.

An electrical testing system, comprising:

• a first electrical device to detect at least two parameters of an electrical system, the first electrical device comprising:
• a probe element that is configured to be placed into contact with the electrical system and provide an input signal thereto;
• a processor electrically connected to the conducting probe element and configured to (a) manipulate the input signal provided to the electrical system, and (b) receive an output signal representative of one or more parameters of the at least two parameters of the electrical system;
• a second electrical device for (i) preserving memory settings of the electrical system, and (ii) deriving any parasitic draw within the electrical system, the second electrical device comprising:
• a first power supply for providing power to the electrical system, which enables the second electrical device to maintain memory of electrical system settings of the electrical system during disconnect of a power source of the electrical system;
• one or more sensors for detecting presence of at least one parameter and/or flow of the at least one parameter from a power supply of the second electrical device to the electrical system;
• an analyzer electrically coupled to the one or more sensors and configured to derive parasitic draw of the electrical system based on the detection of the at least one parameter;
• a third electrical device for determining amperage of an electrical element of the electrical system, the third electrical device comprising:
• a first conductive probe element;
• a second conductive probe element;
• a processor in electrical communication with the first conductive probe element and the second conductive probe element;
• and
• a data storage location storing impedance data for a list of electrical elements, the list of electrical elements including the electrical element of the electrical system.

An electrical testing kit, comprising:

• a first electrical device to detect at least two parameters of an electrical system, the first electrical device comprising:
• a probe element that is configured to be placed into contact with the electrical system and provide an input signal thereto;
• a processor electrically connected to the conducting probe element and configured to (a) manipulate the input signal provided to the electrical system, and (b) receive an output signal representative of one or more parameters of the at least two parameters of the electrical system;
• a second electrical device for (i) preserving memory settings of the electrical system, and (ii) deriving any parasitic draw within the electrical system, the second electrical device comprising:
• a power supply for providing power to the electrical system, which enables the second electrical device to maintain memory of electrical system settings of the electrical system during disconnect of a power source of the electrical system;
• one or more sensors for detecting presence of at least one parameter and/or flow of the at least one parameter from the power supply of the second electrical device to the electrical system;
• an analyzer electrically coupled to the one or more sensors and configured to derive parasitic draw of the electrical system based on the detection of the one or more parameters;
• a third electrical device for determining amperage of an electrical element of the electrical system, the third electrical device comprising:
• a first conductive probe element;
• a second conductive probe element;
• a processor in electrical communication with the first conductive probe element and the second conductive probe element;
• and
• a data storage location storing impedance data for a list of electrical elements, the list of electrical elements including the electrical element of the electrical system.