Phase change material device and methods for forming the same
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsChang-Chih HUANG, Chih-Ren HSIEH, Kuo-Pin CHANG, Kuo-Ching HUANG
Life of this patent
Estimating the term…
Loading patent…
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsChang-Chih HUANG, Chih-Ren HSIEH, Kuo-Pin CHANG, Kuo-Ching HUANG
Estimating the term…
A phase change memory device may be provided by forming a bottom electrode, a dielectric material layer, and a via opening extending through the dielectric material layer such that a top surface segment of the bottom electrode is exposed underneath the via opening; forming a tubular dielectric spacer in a peripheral region of the via opening; depositing a continuous layer stack including a heater liner layer, a phase change material layer comprising a phase change material, and a top electrode material layer over the dielectric material layer and the tubular dielectric spacer; and patterning the continuous layer stack into a layer stack including a heater liner, a phase change material portion, and a top electrode.
A method of forming a device structure, comprising:
A method of forming a device structure, comprising:
A device structure comprising:
Dependencies are inferred from the claim text.