US 2026/0121958 A1Published application

Jitter tolerance measurement apparatus and jitter tolerance measurement method

AssigneeAnritsu Corporation

InventorsMitsutaka ITO, Tatsuya IWAI, Hironori YOSHIOKA

Life of this patent

Estimating the term…

Loading patent…

Abstract

A jitter tolerance measurement apparatus includes an error measurement unit that measures an error measurement value of an output signal of a DUT that receives a pattern signal in synchronization with a jitter clock subjected to phase modulation by a jitter modulation signal, over a predetermined measurement time, a jitter tolerance measurement unit that changes jitter amplitude and jitter frequency of the jitter modulation signal to estimate, as a jitter tolerance of the DUT, a maximum jitter amplitude at which the error measurement value measured by the error measurement unit is equal to or less than a predetermined allowable value for each jitter frequency, a confidence level calculation unit that calculates a confidence level related to an allowable value of an error rate of the output signal of the DUT, and a display unit that displays result display screens showing the jitter tolerance and the confidence level.

Claims8

Dependent claims

A jitter tolerance measurement apparatus comprising:

a jitter modulation signal output unit that outputs a jitter modulation signal having variable jitter amplitude and jitter frequency;
a jitter clock output unit that receives the jitter modulation signal from the jitter modulation signal output unit and outputs a jitter clock subjected to phase modulation in accordance with the jitter amplitude and the jitter frequency;
a pattern signal generation unit that outputs a pattern signal in synchronization with the jitter clock to a device under test;
an error measurement unit that measures the number of errors and an error rate of an output signal of the device under test that receives the pattern signal, over a predetermined measurement time;
a jitter tolerance measurement unit that changes the jitter amplitude and the jitter frequency of the jitter modulation signal output from the jitter modulation signal output unit to estimate, as a jitter tolerance of the device under test, a maximum jitter amplitude at which the number of errors or the error rate measured by the error measurement unit is equal to or less than a predetermined allowable value for each jitter frequency;
a display unit that displays a result display screen showing the jitter tolerance and a setting screen for performing setting related to a measurement condition for the jitter tolerance,
in which the result display screen displays the jitter tolerance and a confidence level, and
the setting screen includes
a measurement time input unit to which the measurement time of the output signal is input, and
a target error rate input unit to which an allowable value of the error rate of the output signal is input;
and
a confidence level calculation unit that calculates the confidence level related to the allowable value of the error rate of the output signal,
wherein the confidence level calculation unit calculates the confidence level based on a data rate of the output signal, the number of errors of the output signal in a case where the jitter tolerance is obtained by the jitter tolerance measurement unit, and the measurement time and the allowable value of the error rate that are input to the setting screen.

10 more elements

A jitter tolerance measurement method using a jitter tolerance measurement apparatus including

a jitter modulation signal output unit that outputs a jitter modulation signal having variable jitter amplitude and jitter frequency,
a jitter clock output unit that receives the jitter modulation signal from the jitter modulation signal output unit and outputs a jitter clock subjected to phase modulation in accordance with the jitter amplitude and the jitter frequency,
a pattern signal generation unit that outputs a pattern signal in synchronization with the jitter clock to a device under test,
an error measurement unit that measures the number of errors and an error rate of an output signal of the device under test, which receives the pattern signal, over a predetermined measurement time,
a jitter tolerance measurement unit that changes the jitter amplitude and the jitter frequency of the jitter modulation signal output from the jitter modulation signal output unit to estimate, as a jitter tolerance of the device under test, a maximum jitter amplitude at which the number of errors or the error rate measured by the error measurement unit is equal to or less than a predetermined allowable value for each jitter frequency, and
a display unit that displays a result display screen showing the jitter tolerance and a setting screen, the jitter tolerance measurement method comprising:
a setting screen display step of displaying, on the display unit, the setting screen for being used to perform setting related to a measurement condition for the jitter tolerance;
an input step of inputting the measurement time of the output signal and an allowable value of the error rate of the output signal to the setting screen;
a confidence level calculation step of calculating a confidence level related to the allowable value of the error rate based on a data rate of the output signal, the number of errors of the output signal in a case where the jitter tolerance is obtained by the jitter tolerance measurement unit, and the measurement time and the allowable value of the error rate that are input to the setting screen;
and
a result display screen display step of displaying, on the display unit, the result display screen showing the jitter tolerance and the confidence level,
wherein the setting screen includes
a measurement time input unit to which the measurement time of the output signal is input, and
a target error rate input unit to which the allowable value of the error rate of the output signal is input.

11 more elements

Dependencies are inferred from the claim text.