Self-excitation lithography method with self-alignment effect
AssigneeInstitute of Microelectronics, Chinese Academy of Sciences
InventorsLibin Zhang, Dinghai Rui, Yayi Wei, Yajuan Su
Life of this patent
Estimating the term…
Loading patent…
AssigneeInstitute of Microelectronics, Chinese Academy of Sciences
InventorsLibin Zhang, Dinghai Rui, Yayi Wei, Yajuan Su
Estimating the term…
A self-excitation lithography method with a self-alignment effect. During the first lithography processing, the first mask is used merely to define an effective lithography region for the second lithography processing. Therefore, the first mask may be of a relatively large size, thereby greatly reducing the manufacturing difficulty of the first mask. Since the first metal layer and the second metal layer are both material layers having a negative refractive index, and a thickness difference exists in the second photoresist layer respectively corresponding to the first metal layer and the second metal layer, after performing simulation and optimization, resolution enhancement can be achieved in the region corresponding to the protruding structure, thereby realizing a self-alignment lithographic-pattern imaging with the self-excitation effect only in the region corresponding to the protruding structure.
A self-excitation lithography method with a self-alignment effect, comprising:
Dependencies are inferred from the claim text.