Test and/or measurement system

A test and/or measurement system, comprising:

• a base unit comprising a plurality of test ports which are connectable to a device-under-test, DUT;
• wherein the base unit comprises at least one port unit which is electrically connected to one of the plurality of test ports;
• and
• wherein the at least one port unit comprises an image-free receiver circuit, wherein an input of the image-free receiver circuit is directly or indirectly connected to the one test port;
• the test and/or measurement system further comprising:
• at least one ADC unit, wherein an output of the image-free receiver circuit is electrically connected to the at least one ADC unit;
• and
• a signal source configured to generate a stimulus signal and/or a known noise source configured to generate a noise signal;
• wherein, if the test and/or measurement system operates in an S-parameter measurement mode, the stimulus signal is feedable to a first port of the DUT;
• and/or, if the test and/or measurement system operates in a noise measurement mode, the noise signal is feedable to the first port or to a second port of the DUT;
• and
• wherein the input of the image-free receiver circuit is connectable to the first port or the second port of the DUT.