X-ray inspection device

An X-ray inspection device comprising:

• a first conveyor configured to convey a first article at a first conveying speed;
• a second conveyor configured to convey a second article at a second conveying speed while the first article is being conveyed on the first conveyor at the first conveying speed, the second conveying speed being different from the first conveying speed;
• an X-ray irradiation unit configured to radiate X-rays toward the first article conveyed by the first conveyor and the second article conveyed by the second conveyor;
• an X-ray line sensor configured to detect an amount of X-rays transmitted through the first article and the second article at a timing based on the first conveying speed of the first conveyor;
• and
• a control unit configured to generate a first X-ray image, which is an X-ray image of the first article, and a second X-ray image, which is an X-ray image of the second article, on the basis of detection results from the X-ray line sensor, and to inspect the first article and the second article on the basis of the first X-ray image and the second X-ray image, respectively,
• the control unit being configured to correct an effect of a speed difference between the first conveying speed and the second conveying speed in inspection of the second article based on the second X-ray image.