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US 2026/0108952 A1Published application
Surface coated cutting tools
OwnerKimaya Vyavhareinventor
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Abstract
In one aspect, cutting tools are described herein comprising refractory coatings comprising MT-TiCN and α-Al2O3 layers having crystallographic orientations and architectures advantageous for resisting various degradative mechanisms including cracking and/or flaking. Accordingly, cutting tools having such refractory coatings, in some embodiments, are suitable for high wear and/or abrasion applications, such as metal cutting operations.
Claims20
A coated cutting tool comprising:
- a substrate;
- and
- a multilayered coating adhered to the substrate comprising:
- a layer of medium temperature (MT) TiCN deposited by chemical vapor deposition (CVD), wherein the MT-TiCN layer comprises columnar grains having inclinations of 0° to 10° between a normal line of a (112) crystal plane and a normal line to the substrate occupying at least 35 area percent of a polished cross-sectional area of the MT-TiCN layer as determined by EBSD;
- and
- a layer of α-Al2O3 deposited by CVD over the MT-TiCN layer, the α-Al2O3 layer comprising columnar grains having inclinations of 0° to 10° between a normal line of a (0001) crystal plane and a normal line to the substrate of occupying 35-65 percent area of a polished cross-sectional area of the α-Al2O3 layer as determined by EBSD.
3 more elements
A method comprising:
- providing a substrate;
- depositing a layer of medium temperature (MT) TiCN deposited by chemical vapor deposition (CVD) over the substrate, wherein the MT-TiCN layer comprises columnar grains having inclinations of 0° to 10° between a normal line of a (112) crystal plane and a normal line to the substrate occupying at least 35 area percent of a polished cross-sectional area of the MT-TiCN layer as determined by EBSD;
- and
- depositing a layer of α-Al2O3 by CVD over the MT-TiCN layer, the α-Al2O3 layer comprising columnar grains having inclinations of 0° to 10° between a normal line of a (0001) crystal plane and a normal line to the substrate occupying 35-65 percent area of a polished cross-sectional area of the α-Al2O3 layer as determined by EBSD.
1 more element
Dependencies are inferred from the claim text.