Quadrupole mass filters and related systems and methods

Abstract

What is disclosed herein are quadrupole mass filters (QMF) and related methods. The QMFs may have a relatively high surface roughness and/or be additively manufactured, wherein the QMF may be configured for ion filtering in a mass spectrometer. The methods may comprise: a. applying transverse sections to produce a dielectric part; b. masking one or more surfaces of the dielectric part to produce a partially masked dielectric part; c. positioning a metal on the partially masked dielectric part with a metal conductor to produce one or more electrically conductive surfaces on the printed part; and d. removing the mask from the printed part to produce a finished QMF; wherein the QMF is configured for ion filtering in a mass spectrometer.

Dependencies are inferred from the claim text.