# US 2026/0101698 A1 · Substrate processing apparatus

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- Number: US 2026/0101698 A1
- Document ID: US20260101698A1
- Status: Published application
- Kind: A1
- Application number: 19/114,272
- Filed: 2023-07-24
- Published: 2026-04-09
- Earliest claimed: 2022-09-21
- Assignees: SCREEN Holdings Co., Ltd.
- Applicants: Screen Holdings Co., Ltd.
- Inventors: Shuhei NEMOTO; Kazuhiro SHOJI; Tomohiro UEMURA; Yusuke SATO; Norimasa MATSUI
- Web page: https://patentgrep.com/patent/US20260101698A1

## CPC

- H10P 72/0421: {for drying etching}
- H10P 50/00: Etching of wafers, substrates or parts of devices
- H10P 52/00: Grinding, lapping or polishing of wafers, substrates or parts of devices
- H10P 72/78: using vacuum or suction, e.g. Bernoulli chucks
- H10P 72/7616: {characterised by a coating, a hardness or a material}
- H10P: GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10

## Abstract

The present invention has an upper surface protecting/heating mechanism that heats a substrate while covering an upper surface of the substrate held by the substrate holder. In the upper surface protecting/heating mechanism, a base block, a first under block and a second under block are combined to form a clearance region and an annular air outlet. Gas flowing in the clearance region is heated by a peripheral edge heating part and then supplied from the annular air outlet to the vicinity of the peripheral edge part of the upper surface of the substrate. The peripheral edge heating part heats not only the peripheral edge part of the upper surface of the substrate but also the peripheral edge part of the substrate to a temperature suitable for the substrate processing in a short time.

## Claims

### Claim 1

A substrate processing apparatus, comprising:
a substrate holder provided rotatably about an axis of rotation extending in a vertical direction while holding a substrate in a substantially horizontal posture;
a rotating mechanism configured to rotate the substrate holder about the axis of rotation;
a processing mechanism configured to perform substrate processing on a peripheral edge part of the substrate by supplying a processing liquid to a peripheral edge part of an upper surface of the substrate held by the substrate holder rotated by the rotating mechanism; and
an upper surface protecting/heating mechanism configured to heat the substrate while being configured to cover the upper surface of the substrate held by the substrate holder, wherein
the upper surface protecting/heating mechanism includes:
a base block in which a first opening is provided at a central part of an upper surface thereof, a second opening wider than the first opening is provided at a central part of an upper surface thereof, and a funnel-like space having an inner diameter which becomes larger as it goes downward from the first opening and is connected to the second opening;
a first under block, in which a third opening having the same shape as the second opening is provided with at a central part of an upper surface thereof, and a penetration space is formed so as to penetrate from the third opening toward a central part of a lower surface thereof and has a hollow shape, being coupled to the base block in a state where the third opening coincides with the second opening and a lower surface of a peripheral edge part thereof faces the peripheral edge part of the upper surface of the substrate;
a peripheral edge heating part provided in the first under block; and
a second under block coupled to the base block with the lower surface thereof facing a central part of the upper surface of the substrate while being loosely inserted into the penetration space and the funnel-like space,
an annular air outlet formed between the lower surface of the first under block and the lower surface of the second under block in the vicinity of the peripheral edge part of the upper surface of the substrate is connected to the first opening through a clearance region between the base block and the first under block and the second under block, and
the peripheral edge heating part heats the gas flowing in the clearance region and heats the peripheral edge part of the upper surface of the substrate.

### Claim 2 (depends on 1)

The substrate processing apparatus according to claim 1, wherein
the substrate holder is a spin chuck made of resin, with an upper surface thereof adsorbing a central part of a lower surface of the substrate to thereby hold the substrate.

### Claim 3 (depends on 2)

The substrate processing apparatus according to claim 2, wherein
the upper surface of the spin chuck is narrower than the lower surface of the second under block and positioned vertically below the lower surface of the second under block in a horizontal plane.

### Claim 4 (depends on 1)

The substrate processing apparatus according to claim 1 further comprising:
a central heating part provided in the second under block and configured to heat the gas flowing in the clearance region and the central part of the substrate.

### Claim 5 (depends on 4)

The substrate processing apparatus according to claim 4, wherein
the amount of heat generation of the peripheral edge heating part and that of the central heating part are adjustable independently of each other.

### Claim 6 (depends on 5)

The substrate processing apparatus according to claim 5, wherein
the amount of heat generation of the peripheral edge heating part is higher than that of the central heating part.