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US 2026/0100239 A1Published application
Alignment tip for a characterization device
AssigneeSynchrotron Soleil
InventorsAntoine LONCLE, Robin LENER, Stefan KUBSKY, François NICOLAS
Life of this patent
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Abstract
An alignment tip for a sample characterization device, the alignment tip includes an alignment head that is made of a material having an atomic weight greater than 50 and has an essentially spherical shape, and a body that is connected to the alignment head and is configured to be placed in a sample support.
Claims11
An alignment tip to be aligned with respect to a measuring beam in a sample characterization device, the alignment tip comprising:
- an alignment head that is made of a material having an atomic weight greater than 50 and has an essentially spherical shape;
- and
- a body that is connected to the alignment head, and is configured to be placed in a sample support.
Dependencies are inferred from the claim text.