Adaptive integrity scan in a memory sub-system
AssigneeMicron Technology, Inc.
InventorsLi-Te Chang, Murong Lang, Zhenming Zhou
Life of this patent
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Abstract
A processing device in a memory sub-system detects an occurrence of a data integrity check trigger event in the memory sub-system, and in response, identifies a memory die of a plurality of memory dies in the memory sub-system. The processing device further determines a read margin associated with a first distribution of memory cells of the identified memory die, and determines an adaptive scan frequency for the identified memory die based on the read margin associated with the first distribution of memory cells.
Claims20
A system comprising:
- a plurality of memory dies;
- a processing device, operatively coupled with the plurality of memory dies, to perform operations comprising:
- determining that an adaptive scan frequency for a given memory die of the plurality of memory dies has been reached, wherein the adaptive scan frequency is based on a read margin associated with a first distribution of memory cells of the given memory die;
- performing a data integrity check to determine a reliability statistic for a segment of the given memory die;
- determining whether the reliability statistic satisfies a folding criterion;
- and
- responsive to determining that the reliability statistic satisfies the folding criterion, performing a folding operation on the segment of the given memory die.
A method comprising:
- determining that an adaptive scan frequency for a given memory die of a plurality of memory dies has been reached, wherein the adaptive scan frequency is based on a read margin associated with a first distribution of memory cells of the given memory die;
- performing a data integrity check to determine a reliability statistic for a segment of the given memory die;
- determining whether the reliability statistic satisfies a folding criterion;
- and
- responsive to determining that the reliability statistic satisfies the folding criterion, performing a folding operation on the segment of the given memory die.
A non-transitory computer-readable storage medium comprising instructions that, when executed by a processing device, cause the processing device to perform operations comprising:
- determining that an adaptive scan frequency for a given memory die of a plurality of memory dies has been reached, wherein the adaptive scan frequency is based on a read margin associated with a first distribution of memory cells of the given memory die;
- performing a data integrity check to determine a reliability statistic for a segment of the given memory die;
- determining whether the reliability statistic satisfies a folding criterion;
- and
- responsive to determining that the reliability statistic satisfies the folding criterion, performing a folding operation on the segment of the given memory die.
Dependencies are inferred from the claim text.