Reflective mask blank and method for manufacturing the same
AssigneeShin-Etsu Chemical Co., Ltd.
InventorsAtsuhiro TAKEDA, Riku Muneyasu
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AssigneeShin-Etsu Chemical Co., Ltd.
InventorsAtsuhiro TAKEDA, Riku Muneyasu
Estimating the term…
A reflective mask blank having auxiliary marks that can be formed with a simple structure and little risk of particle generation in a reference mark. The reflective mask blank including at least a substrate, a multilayer reflective film provided thereon and reflecting exposure light, and an absorber film provided on the film and absorbing the exposure light, and further includes a reference mark formed on a surface on a same side as the film of the blank, the reference mark consists of a main mark serving as a reference position for a defect position, and an auxiliary mark group disposed around the main mark, the auxiliary mark group consists of a plurality of auxiliary marks formed at intervals from one another to extend in at least one direction starting from the main mark, and the plurality of auxiliary marks are formed in a same shape and in a same orientation.
A reflective mask blank comprising at least:
A method for manufacturing a reflective mask blank, comprising at least steps of:
Dependencies are inferred from the claim text.