Systems and methods for measuring time or capacitance
AssigneeMicrochip Technology Incorporated
InventorsEzana Haile, Bogdan Bolocan, Sorin Spanoche
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AssigneeMicrochip Technology Incorporated
InventorsEzana Haile, Bogdan Bolocan, Sorin Spanoche
Estimating the term…
A system includes a first capacitor, a second capacitor, voltage measurement circuitry to perform differential voltage measurements between the first and second capacitors, and control circuitry to (a) set a ready state with the first capacitor charged and the second discharged, and control the voltage measurement circuitry to perform a pre-event differential voltage measurement between the charged first capacitor and discharged second capacitor, (b) determine an event start, and in response, connect the first capacitor to a low impedance node to effect a partial discharge, and also connect the second capacitor to a low impedance node, and (c) determine an event stop, and in response, control the voltage measurement circuitry to perform post-event differential voltage measurement(s) between the partially discharged first capacitor and the second capacitor, and calculate an event duration between the event start and event stop based on the pre-event differential voltage measurement and post-event differential voltage measurement(s).
A system, comprising:
A system, comprising:
A method, comprising:
Dependencies are inferred from the claim text.