Multifunctional sample stage for in-situ testing with transmission electron microscope and atom probe tomography

A multifunctional sample stage for in-situ testing with transmission electron microscope and atom probe tomography, comprising:

• a support stage comprising a base body, the base body having a first-step tier and a second-step tier;
• a metal pressing plate, wherein a first portion of the metal pressing plate is fixed to the first-step tier, and a second portion of the metal pressing plate is engageable with a silicon wafer carrying specimens disposed on the second-step tier;
• and a sample mounting stage assembly positionable on the second-step tier, wherein a metal support grid for carrying specimens is capable of being fixed to the sample mounting stage assembly;
• wherein, the sample mounting stage assembly comprises:
• a concave sample stage having formed thereon at least one recessed mounting position, the concave sample stage comprising a vertical surface at a location corresponding to the recessed mounting position, wherein a metal support grid carrying specimens is positionable at the recessed mounting position adjacent to the vertical surface;
• and a convex fixing stage having formed thereon a protruding end engageable with the recessed mounting position,
• wherein the protruding end is capable of being inserted into the corresponding recessed mounting position to clamp the specimen-carrying metal support grid between the protruding end and the vertical surface.