A Metering Stack and System for Collecting a Target Sample for Testing
AssigneeGoogle Inc.
InventorsJunyu Mai, Herschel Max Watkins, Paul Joseph Silberschatz, Keith Adam Wong
Life of this patent
Estimating the term…
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AssigneeGoogle Inc.
InventorsJunyu Mai, Herschel Max Watkins, Paul Joseph Silberschatz, Keith Adam Wong
Estimating the term…
A metering stack for collecting a target sample includes a channel layer spacing a top layer from a bottom layer, where the top, bottom, and channel layers together define a channel. The channel has an inlet end, a main channel portion, a separation portion, and one or more dispensing portions. A vent is defined within the metering stack proximate the separation portion, where the vent allows air to enter the metering stack into the separation portion. The vent has a first wall extending between a first end and a second end, and a curved wall extending between the first end and the second end, with at least a portion of the first wall being closer than the curved wall to the main channel portion and with the first wall being at an angle relative to a main axis of the main channel portion.
A metering stack for collecting a target sample for testing, the metering stack comprising:
A testing system for collecting a target sample for testing, the testing system comprising:
A metering stack for collecting a target sample for testing, the metering stack comprising:
Dependencies are inferred from the claim text.