Artificial intelligence based automated testing and early failure prediction system and method thereof

A method for facilitating testing of a System under Test (SUT), comprising:

• receiving SUT information of each of one or more devices associated with the SUT, wherein the SUT information comprises component information and operational characteristics of the one or more devices;
• dynamically assigning at least one hardware configuration to each of the one or more devices based on the SUT information;
• creating at least one device classification group to include the one or more devices based on the assigned configuration;
• generating a test template for each of the generated at least one device classification group based on the SUT information, wherein the test template include a sequence of operations to be performed on the one or more devices;
• identifying a test sequence for each of the generated at least one device classification group, wherein the test sequence is indicative of an order in which testing on the generated at least one device classification group is to be performed;
• and
• performing testing, during real time operation, of the one or more devices associated with the SUT within the at least one device classification group based on the generated test template, identified test sequence, and the assigned hardware configuration to determine health status of the one or more devices.

A non-transitory computer-readable medium storing computer-executable instructions for facilitating testing of a System under Test (SUT), the computer-executable instructions configured for:

• receiving SUT information of each of one or more devices associated with the SUT, wherein the SUT information comprises component information and operational characteristics of the one or more devices;
• dynamically assigning at least one hardware configuration to each of the one or more devices based on the SUT information;
• creating at least one device classification group to include the one or more devices based on the assigned configuration;
• generating a test template for each of the generated at least one device classification group based on the SUT information, wherein the test template include a sequence of operations to be performed on the one or more devices;
• identifying a test sequence for each of the generated at least one device classification group, wherein the test sequence is indicative of an order in which testing on the generated at least one device classification group is to be performed;
• and
• performing testing, during real time operation, of the one or more devices associated with the SUT within the at least one device classification group based on the generated test template, identified test sequence, and the assigned hardware configuration to determine health status of the one or more devices.