Test apparatus, test method, and program
AssigneeAdvantest Corporation
InventorsTokunori AKITA, Takeshi KAWAKAMI, Masaki FUJIWARA
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AssigneeAdvantest Corporation
InventorsTokunori AKITA, Takeshi KAWAKAMI, Masaki FUJIWARA
Estimating the term…
Provided is a test apparatus including: a pattern generation unit which generates a protocol pattern for testing a device under test, the protocol pattern having a plurality of cycles, each cycle consisting of a predetermined specified number of at least one signal pattern; and a sequence control unit which controls the pattern generation unit in accordance with a first instruction having a plurality of steps and a second instruction having a plurality of steps, wherein the pattern generation unit generates the protocol pattern such that at least one cycle of the plurality of cycles includes a signal pattern corresponding to at least one step included in the first instruction and a signal pattern corresponding to at least one step included in the second instruction.
A test apparatus comprising:
A test method comprising:
A non-transitory computer-readable medium having recorded thereon a program which, when executed by a computer, causes the computer to function as:
Dependencies are inferred from the claim text.