US 2026/0079175 A1 · MANAGEMENT OF DISTRIBUTED MATERIAL TESTING SYSTEMS

Abstract

Described herein are examples of distributed material testing systems that collect data from a plurality of material testing systems. In some examples, a central management server is used to collect the data and identify status information, statistical metrics, and/or historical events pertaining to selected material testing systems based on the collected data. In some examples, because the central management server is used, the status information, statistical metrics, and/or historical events can be accessed through any interface in communication with the central management server. In some examples, the status information, statistical metrics, and/or historical events may be used by managers and/or administrators to monitor testing activities, identify and/or address issues, and/or plan for future tests.

Claims20

Dependent claims

A non-transitory computer readable medium comprising machine readable instructions which, when executed by processing circuitry, cause the processing circuitry to:

receive test data from one or more material testing systems, the test data relating to testers, test parameters, test results, or test timings of a plurality of tests conducted using the one or more material testing systems;
determine a utilization metric based on the test data, the utilization metric indicating how much or how often a particular material testing system, or the one or more of material testing systems were used during a selected time period;
output, via a user interface, a human perceptible representation of the utilization metric.

A system, comprising:

one or more material testing systems configured to conduct a plurality of tests on a plurality of material specimens, and transmit test data relating to testers, test parameters, test results, or test timings of the plurality of tests;
a central server configured to receive the test data from the one or more material testing systems, the central server comprising central server processing circuitry configured to determine a utilization metric based on the test data, the utilization metric indicating how much or how often a particular material testing system, or the plurality of material testing systems were used during a selected time period;
a user interface in communication with the central server, the user interface being configured to output a human perceptible representation of the utilization metric.

A method, comprising:

receiving, at a central server, test data from one or more material testing systems, the test data relating to testers, test parameters, test results, or test timings of a plurality of tests conducted using the one or more material testing systems;
determining, at the central server, a utilization metric based on the test data, the utilization metric indicating how much or how often a particular material testing system, or the one or more material testing systems were used for testing during a selected time period;
and
outputting, via a user interface, a human perceptible representation of the utilization metric.

1 more element

Dependencies are inferred from the claim text.

Management of distributed material testing systems

Life of this patent

Management of distributed material testing systems

Life of this patent

Abstract

Claims20