Polar-Azimuth Spectral Imaging and Analysis Device with Modular Sample Stage

A method for scanning the spectrum of an emissive material, the method comprising:

• providing an apparatus for scanning properties of a material, the apparatus comprising:
• a stationary sample stage configured to support a material in a fixed position;
• a first motor operatively coupled to a rotation stage configured to rotate the rotation stage about a first axis to scan the material along an azimuthal angle;
• a second motor mechanically coupled to the rotation stage configured to rotate about a second axis, perpendicular to the first axis, to scan the material along a polar angle;
• a control system communicatively coupled to the first and second motors configured to transmit an electrical signal to the first and second motors to coordinate a rotation of an optical system about the stationary sample stage enabling scanning of the material across a range of azimuthal and polar angles;
• and
• collecting a spectrum data, wherein the apparatus for scanning properties of material is configured to record the spectrum data form the sample at the current azimuth and polar angle settings.

A method of manufacturing an apparatus for scanning properties of a material, the method comprising:

• assembling a rotation stage about a stationary sample stage whereby the rotation stage rotates about an axis around the stationary sample stage;
• operably coupling a first motor to the rotation stage configured to rotate the rotation stage about an axis to scan a material along an azimuthal angle;
• mounting a second motor onto the rotation stage configured to rotate about a second axis perpendicular to the first axis to scan a material along a polar angle;
• and
• communicatively coupling a control system to the first and second motors, wherein the control system is configured to transmit electrical signals to coordinate the rotation of an optical system to enable scanning of a material across a range of azimuthal and polar angles.