# US 2026/0076152 A1 · Semiconductor structures having backside metal die damage rings and methods for manufacturing and testing thereof

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- Number: US 2026/0076152 A1
- Document ID: US20260076152A1
- Status: Published application
- Kind: A1
- Application number: 18/882,231
- Filed: 2024-09-11
- Published: 2026-03-12
- Earliest claimed: 2024-09-11
- Assignees: Taiwan Semiconductor Manufacturing Company, Ltd.
- Applicants: Taiwan Semiconductor Manufacturing Company, Ltd.
- Inventors: Cing-Yao Jhan; Tsung-Yu Chiang; Chi-Ruei Yeh
- Web page: https://patentgrep.com/patent/US20260076152A1

## CPC

- H10P 74/273: {Interconnections for measuring or testing, e.g. probe pads}
- H10P 74/207: {Electrical properties, e.g. testing or measuring of resistance, deep levels or capacitance-voltage characteristics}
- H10P 74/277: {Circuits for electrically characterising or monitoring manufacturing processes, e.g. circuits in tested chips or circuits in testing wafers}
- H10W 20/023: {the interconnections being through-semiconductor vias}
- H10W 20/43: Layouts of interconnections
- H10W 42/00: Arrangements for protection of devices (arrangements for thermal protection H10W40/00)
- H10P: GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10W: GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10

## Abstract

Semiconductor structures and methods for manufacturing and testing semiconductor structures are provided. The semiconductor structures include an integrated circuit formed in a semiconductor substrate, a seal ring on at least a first side of the semiconductor substrate and surrounding a perimeter of the integrated circuit, an input element, an output element, and a backside metal die damage ring (BMDDR) disposed on the first side of the semiconductor substrate, extending through the semiconductor substrate, and disposed on a second side of the semiconductor substrate, the BMDDR disposed between the integrated circuit and the seal ring, the BMDDR at least partially surrounding the perimeter of the integrated circuit, the BMDDR coupled to and forming an electrical circuit between the input element and the output element.

## Claims

### Claim 1

A semiconductor structure, comprising:
an integrated circuit formed in a semiconductor substrate;
a seal ring on at least a first side of the semiconductor substrate and surrounding a perimeter of the integrated circuit;
an input element;
an output element; and
a backside metal die damage ring (BMDDR) disposed on the first side of the semiconductor substrate, extending through the semiconductor substrate, and disposed on a second side of the semiconductor substrate, the BMDDR disposed between the integrated circuit and the seal ring, the BMDDR at least partially surrounding the perimeter of the integrated circuit, the BMDDR coupled to and forming an electrical circuit between the input element and the output element.

### Claim 2 (depends on 1)

The semiconductor structure of claim 1, wherein the BMDDR includes an interconnect structure coupled to one or more semiconductor devices formed in the semiconductor substrate.

### Claim 3 (depends on 1)

The semiconductor structure of claim 1, wherein the BMDDR includes a first interconnect structure disposed on the first side of the semiconductor substrate, and a second interconnect structure disposed on a second side of the semiconductor substrate, wherein the first interconnect structure and the second interconnect structure are electrically coupled by first semiconductor devices formed in the semiconductor substrate.

### Claim 4 (depends on 3)

The semiconductor structure of claim 3, wherein the first interconnect structure and the second interconnect structure are each coupled to source/drain structures of the first semiconductor devices therebetween.

### Claim 5 (depends on 4)

The semiconductor structure of claim 4, wherein the second interconnect structure is coupled to the source/drain structures by through substrate vias formed in the second side of the semiconductor substrate.

### Claim 6 (depends on 1)

The semiconductor structure of claim 1, wherein the BMDDR includes a plurality of first units of a first interconnect structure disposed on the first side of the semiconductor substrate, and a plurality of second units of a second interconnect structure disposed on a second side of the semiconductor substrate, wherein the plurality of the first units and the plurality of the second units are electrically coupled to each other in series such that the first units and the second units alternate linearly along the BMDDR and are electrically coupled by semiconductor devices formed in the semiconductor substrate.

### Claim 7 (depends on 6)

The semiconductor structure of claim 6, wherein the plurality of the first units and the plurality of the second units are coupled along the BMDDR in a serpentine pattern.

### Claim 8 (depends on 6)

The semiconductor structure of claim 6, wherein the input element and the output element are pins coupled to the second interconnect structure on the second side of the semiconductor substrate.

### Claim 9 (depends on 1)

The semiconductor structure of claim 1, wherein the input element and the output element are pads coupled to the integrated circuit.

### Claim 10

A method, comprising:
providing a semiconductor substrate having an integrated circuit formed therein and a backside metal die damage ring (BMDDR) disposed on a first side of the semiconductor substrate, extending through the semiconductor substrate, and disposed on a second side of the semiconductor substrate, the BMDDR at least partially surrounding the perimeter of the integrated circuit; and
detecting damage to the BMDDR by applying an electrical load to the BMDDR between an input element and an output element each coupled thereto to detect a disconnect in an electrical circuit defined by the BMDDR.

### Claim 11 (depends on 10)

The method of claim 10, wherein detecting damage to the BMDDR includes measuring a change in resistance or conductivity of the electrical circuit.

### Claim 12 (depends on 10)

The method of claim 10, further comprising inspecting the integrated circuit for damage thereto in response to detecting damage to the BMDDR.

### Claim 13 (depends on 10)

The method of claim 10, wherein the BMDDR includes a plurality of first units of a first interconnect structure disposed on the first side of the semiconductor substrate, and a plurality of second units of a second interconnect structure disposed on a second side of the semiconductor substrate, wherein the plurality of the first units and the plurality of the second units are electrically coupled to each other in series such that the first units and the second units alternate linearly along the BMDDR and are electrically coupled by semiconductor devices formed in the semiconductor substrate.

### Claim 14 (depends on 13)

The method of claim 13, wherein the plurality of the first units and the plurality of the second units are coupled along the BMDDR in a serpentine pattern.

### Claim 15

A method, comprising:
providing a semiconductor substrate having an integrated circuit formed therein;
forming semiconductor devices in the semiconductor substrate;
forming a first interconnect structure on a first side of the semiconductor substrate overlying and electrically coupled to the semiconductor devices;
forming a second interconnect structure on a second side of the semiconductor substrate underlying and electrically coupled to the semiconductor devices, wherein the first interconnect structure, the semiconductor devices, and the second interconnect structure define a backside metal die damage ring (BMDDR) partially or entirely surrounding the integrated circuit;
forming an input element on the semiconductor substrate that is electrically coupled to the BMDDR at a first position; and
forming an output element on the semiconductor substrate that is electrically coupled to the BMDDR at a second position, wherein the BMDDR forms a continuous electrical circuit between the input element and the output element.

### Claim 16 (depends on 15)

The method of claim 15, wherein the first interconnect structure and the second interconnect structure are each coupled to source/drain structures of the semiconductor devices.

### Claim 17 (depends on 15)

The method of claim 15, further comprising forming through substrate vias in the second side of the semiconductor substrate that electrically couple the semiconductor devices and the second interconnect structure.

### Claim 18 (depends on 15)

The method of claim 15, wherein the method includes forming the first interconnect structure to include a plurality of first units and the second interconnect structure to include a plurality of second units, wherein the plurality of the first units and the plurality of the second units are electrically coupled to each other in series such that the first units and the second units alternate linearly along the BMDDR and are electrically coupled by the semiconductor devices formed in the semiconductor substrate.

### Claim 19 (depends on 18)

The method of claim 18, wherein the plurality of the first units and the plurality of the second units are coupled along the BMDDR in a serpentine pattern.

### Claim 20 (depends on 15)

The method of claim 15, further comprising forming a seal ring on the semiconductor substrate that entirely surrounds a perimeter of the BMDDR and the perimeter of the integrated circuit.