Inspection Device and Inspection Method
AssigneeTokyo Electron Limited
InventorsMasahito KOBAYASHI, Fumiya TAKASE
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AssigneeTokyo Electron Limited
InventorsMasahito KOBAYASHI, Fumiya TAKASE
Estimating the term…
An inspection apparatus for an inspection object having an imaging device to which light is incident from a surface opposite to a wiring layer is provided. The inspection apparatus includes a light-transmitting placing table having a placing surface on which the inspection object is placed so that the surface opposite the wiring layer of the imaging device faces the placing surface, a placing table operating part configured to move the placing table vertically and horizontally, and an irradiation device configured to irradiate inspection light to the imaging device through the placing surface. The placing table operating part changes a relative position of the irradiation device with respect to the inspection object placed on the placing surface by moving the placing table.
An inspection apparatus for an inspection object having an imaging device to which light is incident from a surface opposite to a wiring layer, comprising:
An inspection method for inspecting an inspection object having an imaging device to which light is incident from a surface opposite to a wiring layer using an inspection apparatus, wherein the inspection apparatus includes:
Dependencies are inferred from the claim text.