Test handler for electronic component

Abstract

Disclosed relates to a test handler for an electronic component and a handling method of an electronic component. The test handler includes a loading unit performing a loading process of loading an electronic component on a tray and a test unit performing a test process of testing the electronic component stored in the tray. The loading unit loads the electronic component to be tested on the tray in an expansion state in which a size of each of storage grooves of the tray expands greater than a size of the electronic component, and contracts the tray to which the loading process is performed and switches the tray into a contraction state in which a size of each of the storage grooves is reduced.

Dependencies are inferred from the claim text.