Sample support x-ray detector
AssigneeNanoElectronic Imaging, Inc.
InventorWilliam A Hubbard
Life of this patent
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AssigneeNanoElectronic Imaging, Inc.
InventorWilliam A Hubbard
Estimating the term…
A sample support is provided including a base, an insulator, and one or more electrodes. The base has an upper surface with a first aperture and a lower surface with a second aperture. The insulator extends along the upper surface and/or the lower surface of the base. The insulator has a membrane that is a portion of the insulator that extends into the first aperture or the second aperture. One or more electrodes are electrically connected to the base and penetrate the insulator and/or the upper surface of the base. The sample object is placed on the membrane, the sample object emits x-rays, and the base absorbs a portion of the emitted x-rays and generates an electrical current. The electrode measures the electrical current and the electrical current allows for measurement and mapping physical properties of the sample object.
A sample support for imaging a sample object, the sample support comprising:
A sample support for imaging a sample object, the sample support comprising:
A sample support for imaging a sample object, the sample support comprising:
Dependencies are inferred from the claim text.