Method and device for recognizing a process state of a plasma arc method
OwnerMarcel TEMPELHAGEN, Volker KRINK +2inventors
InventorsMarcel TEMPELHAGEN, Volker KRINK, René NOGOWSKI, Vadim GÜNTHER
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Abstract
A method for recognizing a process state of a plasma arc method, in which a workpiece is processed by a plasma torch and measured values of a time curve of a physical variable of the plasma arc method are detected and a signal curve is determined from the measured values. A pattern recognition is performed on the signal curve by extracting at least one feature from the signal curve and classifying the feature, and the signal curve is assigned to a specific state of the plasma arc method according to the classification of the feature.
Claims16
1-14. (canceled)
A method for recognizing a process state of a plasma arc method, in which a workpiece is processed by a plasma torch and measured values of a time curve of a physical variable of the plasma arc method are detected and a signal curve is determined from the measured values, wherein a pattern recognition is performed on the signal curve by extracting at least one feature from the signal curve and classifying said feature, and the signal curve is assigned to a specific state of the plasma arc method according to the classification of the feature.
A device for recognizing a process state of a plasma arc method, comprising a plasma torch for processing a workpiece, a measured value recording device for recording measured values of a time curve of a physical variable of the plasma arc method and for determining a signal curve from the measured values, an evaluation unit for performing a pattern recognition on the signal curve, which evaluation unit is configured to extract at least one feature from the signal curve and to classify said feature and to assign the signal curve to a specific state of the plasma arc method according to the classification of the feature.
A computer program product with a computer program, comprising software means for carrying out a method according to claim 11 by controlling a device when the computer program is run in an automation system, the device recognizing a process state of a plasma arc method, comprising a plasma torch for processing a workpiece, a measured value recording device for recording measured values of a time curve of a physical variable of the plasma arc method and for determining a signal curve from the measured values, an evaluation unit for performing a pattern recognition on the signal curve, which evaluation unit is configured to extract at least one feature from the signal curve and to classify said feature and to assign the signal curve to a specific state of the plasma arc method according to the classification of the feature.
Dependencies are inferred from the claim text.