Methods and apparatus for component/system testing under modulated signals using frequency extenders

A measurement system for testing (RF) components and systems, the measurement system comprising:

• one or more vector network analyzers;
• one or more IF vector signal analyzers;
• one or more IF vector signal generators;
• and
• one or more VNA frequency extenders coupled to said one or more vector network analyzers, said one or more IF vector signal generators and said one or more IF vector signal analyzers,
• wherein said measurement system is configured and selectively operable for continuous-wave (CW) excitation and modulated signal excitation, using a single measurement set up.

A measurement system for testing radio frequency (RF) components and systems comprising:

• one or more devices under test;
• one or more vector network analyzers;
• one or more IF vector signal generators;
• one or more RF Incident and Reflected Wave Analyzers;
• and
• one or more frequency extenders coupled to said one or more IF vector signal analyzers, said one or more IF vector signal generators and said one or more RF Incident and Reflected Wave Analyzers,
• wherein said one or more IF vector signal analyzers and said one or more RF Incident and Reflected Wave Analyzers are coupled to the one or more devices under test and said measurement system is configured and selectively operable for continuous-wave (CW) excitation and modulated signal excitation, using a single measurement set up.

A method for testing RF components and systems comprising:

• generating one or more continuous-wave (CW) signals using one or more VNA frequency extenders;
• generating one or more intermediate frequency (IF) signals by frequency mixing one or more input signals with one or more local oscillator signals using one or more IF vector signal generators;
• generating one or more modulated output signals by frequency multiplying said one or more intermediate frequency (IF) signals using said one or more VNA frequency extenders;
• exciting one or more DUT inputs and outputs with said one or more modulated output signals;
• measuring said one or more DUT inputs and outputs;
• frequency mixing said one or more modulated output signals to produce one or more reference signals;
• and
• analyzing said modulated output signal, said DUT inputs and outputs, and said one or more reference signals using one or more IF vector signal analyzers,
• wherein said measurement system is configured and selectively operable for continuous-wave (CW) excitation and modulated signal excitation, using a single measurement set up.

A measurement system for testing RF components and systems comprising:

• one or more IF vector signal generators;
• said one or more IF vector signal generators configured and operable to generate one or more IF modulated signals;
• one or more VNA frequency extenders, coupled to said one or more IF vector signal generators;
• one or more frequency multipliers in a main signal path configured and operable for frequency multiplication;
• one or more devices under test (DUT) coupled to said one or more VNA frequency extenders;
• one or more RF vector signal analyzers coupled to said devices under test (DUT);
• and
• one or more processing units coupled to the inputs of said one or more VNA frequency extenders, said one or more processing units configured and operable to generate one or more modulated test signals using a linearization algorithm.

A method for testing RF components and systems comprising:

• processing one or more modulated test signals using a linearization algorithm;
• generating one or more intermediate frequency (IF) modulated signals by frequency mixing one or more RF test signals with one or more local oscillator signals using one or more IF vector signal generators;
• generating one or more RF modulated signals by frequency multiplying one or more IF modulated signals using one or more frequency multipliers;
• exciting one or more devices under test (DUT) with said one or more RF modulated signals;
• analyzing said one or more devices under test (DUT) using one or more RF vector signal analyzers.