Asymmetric acquisitions and disjoint time trigger in a test and measurement instrument
AssigneeTektronix, Inc.
InventorRonald Allan Brown
Life of this patent
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AssigneeTektronix, Inc.
InventorRonald Allan Brown
Estimating the term…
A test and measurement instrument includes two or more channels to allow the test and measurement instrument to connect to a device under test (DUT), each channel comprising an analog-to-digital converter (ADC) and one or more trigger engines, each trigger engine to determine one or more trigger conditions, a display to allow the test and measurement instrument to display data from the ADC, a user interface, and one or more processors configured to execute code to cause the one or more processors to acquire data from the two or more channels at a different time than others of the two or more channels in response to one or more trigger conditions. A test and measurement instrument similar to the above except it has at least one channel that has an auxiliary input and a threshold detector instead of an ADC in addition to one or more channels having ADCs.
A test and measurement instrument, comprising:
A test and measurement instrument, comprising:
A method, comprising:
Dependencies are inferred from the claim text.