Semiconductor device, semiconductor module, and method of manufacturing semiconductor device
AssigneeFuji Electric Co., Ltd.
InventorsMotoyoshi KUBOUCHI, Shuntaro YAGUCHI, Takamasa WAKABAYASHI, Takashi YOSHIMURA, Makoto SHIMOSAWA
Life of this patent
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Abstract
A semiconductor device, including: a semiconductor substrate having a main surface; an interlayer insulating film provided on the main surface of the semiconductor substrate; a contact hole penetrating through the interlayer insulating film to reach the semiconductor substrate; a plug electrode embedded in the contact hole; a first barrier metal provided on the interlayer insulating film, the first barrier metal being apart from the plug electrode; and a front electrode provided on the first barrier metal and the plug electrode.
Claims19
A semiconductor device comprising:
- a semiconductor substrate having a main surface;
- an interlayer insulating film provided on the main surface of the semiconductor substrate;
- a contact hole penetrating through the interlayer insulating film to reach the semiconductor substrate;
- a plug electrode embedded in the contact hole;
- a first barrier metal provided on the interlayer insulating film, the first barrier metal being apart from the plug electrode;
- and
- a front electrode provided on the first barrier metal and the plug electrode.
A semiconductor device comprising:
- a semiconductor substrate having a main surface;
- an interlayer insulating film provided on the main surface of the semiconductor substrate;
- a contact hole penetrating through the interlayer insulating film to reach the semiconductor substrate;
- a plug electrode embedded in the contact hole;
- a first barrier metal provided on the interlayer insulating film;
- a second barrier metal provided between a side surface of the plug electrode and the interlayer insulating film;
- a third barrier metal provided between the plug electrode and the semiconductor substrate;
- and
- a front electrode provided on the first barrier metal, wherein
- a top of the plug electrode is free of the first barrier metal, and
- the first barrier metal, the second barrier metal, and the third barrier metal have different compositions.
A method of manufacturing a semiconductor device, the method comprising:
- as a first process, preparing a semiconductor substrate and depositing an interlayer insulating film on a main surface of the semiconductor substrate;
- as a second process, forming a contact hole penetrating through the interlayer insulating film to reach the semiconductor substrate;
- as a third process, depositing a plug electrode on the interlayer insulating film and in the contact hole;
- as a fourth process, removing the plug electrode on the interlayer insulating film while leaving the plug electrode only in the contact hole;
- as a fifth process, depositing a first barrier metal on the plug electrode and the interlayer insulating film;
- as a tenth process, removing the first barrier metal on the plug electrode while leaving the first barrier metal only on the interlayer insulating film;
- and
- as a sixth process, depositing a front electrode on the first barrier metal,
- said first to sixth processes being performed in sequence as mentioned.
Dependencies are inferred from the claim text.