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AssigneeLuxTronic, Inc.
InventorsJames C. Evans, Paul S. George, Christopher J. Piekarski, Christopher Couture Del Valle
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This disclosure provides methods, components, devices, and systems for optimizing bulk palletization of items utilizing machine learning techniques to perform automated inspection throughout the process. Some aspects, more specifically, relate to a method that supports bulk palletization of items using machine learning techniques using sensor data to perform automated inspection of a pallet assembly. Machine learning systems analyze the alignment of the items ensuring proper orientation and positioning for layering. Sensors and cameras continuously capture the items layered onto the pallet where a machine learning system can analyze the data to determine misalignments on the layer. Cameras and sensors capture the side walls of the completed pallet and machine learning systems can analyze the data to detect defects along the side walls. An analysis can be performed to determine the severity of a defect and if the severity exceeds a threshold, then corrective actions resolve the defect.
A method of bulk palletization accumulation and inspection of items, the method comprising:
A system for bulk palletization accumulation and inspection of items, the system comprising:
A non-transitory computer readable storage medium including instructions stored thereon which, when executed by a processor, cause the processor to:
Dependencies are inferred from the claim text.