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US 2026/0056252 A1Published application
Enhanced degradation circuit
AssigneeNXP B.V.
InventorsHenri Verhoeven, Oswald Moonen, Thieu Lammers
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Abstract
One example discloses a degradation circuit, including: a first set of structures configured to be coupled to a semiconductor package; a second set of structures, coupled to the first set of structures, and configured to be coupled to the package; wherein together the first and second set of structures form a Wheatstone bridge within a degradation detection element; and a controller, coupled to the degradation detection element, and configured to set an operational state of an integrated circuit (IC) within the package based on the degradation detection element.
Claims21
A degradation circuit, comprising:
- a first set of structures configured to be coupled to a semiconductor package;
- a second set of structures, coupled to the first set of structures, and configured to be coupled to the package;
- wherein together the first and second set of structures form a Wheatstone bridge within a degradation detection element;
- and
- a controller, coupled to the degradation detection element, and configured to set an operational state of an integrated circuit (IC) within the package based on the degradation detection element.
2 more elements
Dependencies are inferred from the claim text.