US 2026/0049969 A1 · MATERIAL ANALYSIS METHOD

Abstract

In one aspect, the present disclosure relates to a material analysis method which may comprise the steps of: (a) preparing a specimen for structure analysis; (b) training an artificial intelligence model with a training image labelled with a structure aspect of an arbitrary specimen; (c) analyzing a plurality of analysis images not labelled with a structure aspect of a specimen using the trained artificial intelligence model, and removing analysis images classified into preset noise structure aspects; and (d) analyzing, by using the trained artificial intelligence model, the analysis images from which the analysis images classified into the noise structure aspects have been removed, and classifying the analysis images into at least one target structure aspect.

Claims17

Dependent claims

A method for analyzing material comprising:

(a) preparing a specimen for microstructure analysis;
(b) capturing a plurality of analytical images by photographing an inspection area defined on a surface of the specimen;
(c) analyzing the plurality of analytical images using a trained first artificial intelligence (AI) model to remove images classified as exhibiting a predetermined noise microstructure pattern;
and
(d) analyzing remaining analytical images, from which the images classified as exhibiting the noise microstructure pattern have been removed, using a trained second artificial intelligence (AI) model to classify the remaining images into at least one target microstructure pattern.

2 more elements

Dependencies are inferred from the claim text.

Material analysis method

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Material analysis method

Life of this patent

Abstract

Claims17