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AssigneeColgate-Palmolive Company
InventorsBenny E. URBAN, JR., Hrebesh Molly SUBHASH
Estimating the term…
Technologies are disclosed for simultaneous measurement of one or more properties of a sample at one or more sample depths that may be performed by an imaging device. The imaging device may comprise a mirror. The device may comprise a mirrored pinhole array that may comprise one or more pinholes. A mirrored pinhole array cavity may be formed by an arrangement of the mirror and the mirrored pinhole array. The mirrored pinhole array may be configured to focus light from one or more sample planes within the mirrored pinhole array cavity. The device may comprise at least one lens that may be arranged with the mirrored pinhole array to collect the focused light from the one or more sample planes via at least one pinhole of the one or more pinholes. The device may comprise a detector arranged with the at least one lens to receive the collected light.
An imaging device configured for simultaneous measurement of one or more properties of a sample at one or more sample depths, the device comprising:
A method of simultaneously measuring of one or more properties of a sample at one or more sample depths with an imaging device, the imaging device comprising a mirror, a mirrored pinhole array comprising one or more pinholes, at least one lens, and a detector, the method comprising:
Dependencies are inferred from the claim text.