Inspection device and microprobe used therein

Abstract

Provided is an inspection device including: a light source generating and outputting a femtosecond laser beam; a beam splitter configured to split the femtosecond laser beam into a first light and a second light; a first optical array configured to separate the first light into a first sub-light and a second sub-light and to provide the first and the second sub-lights to an inspection target, wherein the first sub-light and the second sub-light are polarized in different directions; a microprobe configured to detect a photoelectric signal caused by incidence of the first and the second sub-lights on the inspection target, the microprobe including a first microprobe configured to detect the first sub-light and a second microprobe configured to detect the second sub-light; and a second optical array configured to provide the second light to the microprobe.

Dependencies are inferred from the claim text.