Spectrometer device and system for detecting incident radiation generated by an object

A spectrometer device for detecting incident radiation generated by an object comprising:

• a measurement window configured for accepting incident radiation generated by an object to enter the spectrometer device wherein the measurement window is at least one of:
• a contact surface, or a lay-on-surface for the object to be investigated;
• a detector array comprising at least two pixelated sensors each having a field of view designed for accepting at least a portion of the incident radiation, wherein each pixelated sensor is configured for generating at least one detector signal related to the accepted incident radiation;
• an optical filter wherein the optical filter is arranged within the field of views of the at least two pixelated sensors wherein the optical filter is configured for generating a spectrum of at least two separated wavelength signals from the incident radiation and transmitting the at least two separated wavelength signals onto the respective at least one pixelated sensor;
• at least one optical element configured for modifying the field of view of at least one pixelated sensor by increasing at least one overlap between the field of views of the at least two pixelated sensors wherein the at least one optical element comprises a first mirror selected from at least one of:
• a first flat mirror;
• or
• a first imaging mirror,
• and wherein the at least one optical element comprises a second mirror selected from at least one of:
• a second flat mirror;
• or
• a second imaging mirror.