Die side interconnect
AssigneeMicron Technology, Inc.
InventorsOwen R. Fay, Brandon P. Wirz, Andrew M. Bayless
Life of this patent
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AssigneeMicron Technology, Inc.
InventorsOwen R. Fay, Brandon P. Wirz, Andrew M. Bayless
Estimating the term…
Methods, systems, and devices for die side interconnect are described. A semiconductor assembly may include a stack of first dies (e.g., memory dies) coupled with a second die (e.g., a logic die) using a sideways architecture. For example, the semiconductor assembly may include multiple first dies, where a top surface of one the first dies is coupled with a bottom surface of another of the first dies to form the stack. The first dies each have a side surface coupled with an upper surface of the second die. The first dies each include a conductive via extending from the top surface of the respective first die at least partially towards the bottom surface of the respective first die. The first dies each include a redistribution layer coupled with the conductive via and extending parallel with the top surface of the respective first die.
A semiconductor device assembly, comprising:
A method of manufacturing a semiconductor device assembly, comprising:
Dependencies are inferred from the claim text.