Memory device including support structures and contact structures having different materials
AssigneeMicron Technology, Inc.
InventorsShuangqiang Luo, John Hopkins
Life of this patent
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AssigneeMicron Technology, Inc.
InventorsShuangqiang Luo, John Hopkins
Estimating the term…
Some embodiments include apparatuses and methods of forming the apparatuses. One of the apparatuses includes tiers located one over another, the tiers including respective memory cells and control gates for the memory cells; a first pillar extending through the tiers and separated from the control gates, the first pillar including a first dielectric liner portion and a first core portion adjacent the first dielectric liner portion, the first dielectric liner portion and the first core portion extending along a length of the first pillar; and a second pillar extending through the tiers and separated from the control gates, the second pillar including a second dielectric liner portion and a second core portion adjacent the second dielectric liner portion, the second dielectric portion and the second core portion extending along a length of the second pillar, wherein the first core portion and the second core portion have different materials.
A method comprising:
A method comprising:
A method comprising:
Dependencies are inferred from the claim text.