Solid-state imaging element and electronic apparatus
AssigneeSony Semiconductor Solutions Corporation
InventorAtsushi MASAGAKI
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Abstract
A solid-state imaging element of an embodiment of the present disclosure includes: a semiconductor substrate including a photoelectric conversion section for each pixel; a pixel transistor provided on one surface of the semiconductor substrate; and an element separation section provided in the semiconductor substrate and including a first element separation section and a second element separation section that have mutually different configurations, the element separation section defining an active region of the pixel transistor, in which the second element separation section has, on a side surface, a first semiconductor region and a second semiconductor region that have mutually different impurity concentrations in a depth direction of the second element separation section.
Claims20
A light detecting device, comprising:
- a semiconductor substrate including:
- a first pixel;
- a second pixel,
- wherein the first pixel is adjacent to the second pixel;
- a trench disposed through the semiconductor substrate;
- and
- a transistor including a gate,
- wherein the gate of the transistor is disposed above one surface of the semiconductor substrate,
- wherein the gate of the transistor is shared by the first pixel and the second pixel and
- wherein the gate of the transistor is disposed directly above the trench in a cross-sectional view.
An electronic apparatus, comprising:
- a light detecting device including:
- a semiconductor substrate including:
- a first pixel;
- a second pixel,
- wherein the first pixel is adjacent to the second pixel;
- a trench disposed through the semiconductor substrate;
- and
- a transistor including a gate,
- wherein the gate of the transistor is disposed above one surface of the semiconductor substrate,
- wherein the gate of the transistor is shared by the first pixel and the second pixel and
- wherein the gate of the transistor is disposed directly above the trench in a cross-sectional view.
Dependencies are inferred from the claim text.