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US 2026/0040644 A1Published application
Semiconductor power device and method for producing same
AssigneeRohm Co., Ltd.
InventorYuki NAKANO
Life of this patent
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Abstract
A method for producing a semiconductor power device includes forming a gate trench from a surface of the semiconductor layer toward an inside thereof. A first insulation film is formed on the inner surface of the gate trench. The method also includes removing a part on a bottom surface of the gate trench in the first insulation film. A second insulation film having a dielectric constant higher than SiO2 is formed in such a way as to cover the bottom surface of the gate trench exposed by removing the first insulation film.
Claims19
A wide bandgap semiconductor device, comprising:
- a semiconductor substrate having a first conductivity type;
- a gate trench formed in the semiconductor substrate;
- a gate insulating film formed on a side of the gate trench and a bottom surface of the gate trench, and partly covering a surface of the semiconductor substrate;
- a gate electrode buried in the gate trench;
- an interlayer insulating film stacked on the semiconductor substrate such that the gate electrode is covered with the interlayer insulating film;
- an intermediate layer disposed over the semiconductor substrate and the interlayer insulating film;
- a metal layer disposed on or over the intermediate layer;
- a first source region having the first conductivity type and a first body region having a second conductivity type disposed along the side of the gate trench, in order from a surface of the semiconductor substrate to a reverse surface of the semiconductor substrate;
- a body contact region electrically connected to the first body region in a cross sectional view;
- a diode region disposed lower than the first body region in a cross sectional view;
- and
- a drain electrode formed on the reverse surface of the semiconductor substrate, the drain electrode including at least Ti and Ni, wherein
- a pn-diode having a pn-junction is disposed in the diode region such that the pn-junction is lower than the bottom surface of the gate trench, and
- a width of the diode region is wider than a width of the first body region.
11 more elements
Dependencies are inferred from the claim text.