US 2026/0036632 A1 · METHOD AND SYSTEM FOR DETECTING ABNORMAL POINT OF BATTERY MANUFACTURING DATA AND ANALYZING ITS CAUSE

Abstract

The present disclosure relates to a method and system for detecting an abnormal point of battery manufacturing data and analyzing its cause. The method is performed by the system for detecting the abnormal point of the battery manufacturing data and analyzing its cause, and includes collecting training data including material information, design information, process information, and information on whether an abnormal point has occurred, of a battery to be analyzed, selecting latent factors that cause the abnormal point from among material elements, design elements, and process elements on the basis of the training data, forming an artificial neural network structure on the basis of the selected latent factors, training the artificial neural network structure on the basis of the training data, and generating an abnormal point cause analysis model.

Claims12

Dependent claims

A method of detecting an abnormal point of battery manufacturing data and analyzing its cause, the method comprising:

collecting, by an abnormal point detection and cause analysis system for detecting the abnormal point of battery manufacturing data and analyzing its cause, training data including material information, design information, process information, and information on whether an abnormal point has occurred, of a battery to be analyzed;
selecting, by the abnormal point detection and cause analysis system, latent factors that cause the abnormal point from among material elements, design elements, and process elements on the basis of the training data;
forming, by the abnormal point detection and cause analysis system, an artificial neural network structure on the basis of the selected latent factors;
training the artificial neural network structure on the basis of the training data;
and
generating an abnormal point cause analysis model.

3 more elements

An abnormal point detection and cause analysis system for detecting an abnormal point of battery manufacturing data and analyzing its cause, comprising:

a non-transitory memory configured to store computer-readable instructions;
and
at least one processor configured to execute the computer-readable instructions,
wherein the at least one processor is configured to, by executing the computer-readable instructions, perform a method comprising:
collecting training data including material information, design information, process information, and information on whether an abnormal point has occurred, of a battery to be analyzed;
selecting latent factors that cause the abnormal point from among material elements, design elements, and process elements on the basis of the training data;
forming an artificial neural network structure on the basis of the selected latent factors;
training the artificial neural network structure on the basis of the training data;
and
generating an abnormal point cause analysis model.

7 more elements

Dependencies are inferred from the claim text.

Method and system for detecting abnormal point of battery manufacturing data and analyzing its cause

Life of this patent

Method and system for detecting abnormal point of battery manufacturing data and analyzing its cause

Life of this patent

Abstract

Claims12