Flip-flops for circuit testing based on scan chains
AssigneeTexas Instruments Incorporated
InventorsPervez Garg, Mudasir Shafat Kawoosa, Piyushkumar Mansukhlal Chaniyara
Life of this patent
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Abstract
An example device described herein includes first functional circuitry, second functional circuitry, and a shift register coupled to the first functional circuitry. The shift register of the example device includes a flip-flop, the flip-flop including a scan-in input coupled to the second functional circuitry, a scan-enable input, and an output. The example device also includes first test circuitry coupled to the scan-enable input and configured to cause the flip-flop to output a first value received by the flip-flop at the scan-in input from the second functional circuitry.
Claims20
A device comprising:
- first functional circuitry;
- second functional circuitry;
- a shift register coupled to the first functional circuitry, wherein the shift register includes a flip-flop, the flip-flop including:
- a scan-in input coupled to the second functional circuitry;
- a scan-enable input;
- and
- an output;
- and
- first test circuitry coupled to the scan-enable input and configured to cause the flip-flop to output a first value received by the flip-flop at the scan-in input from the second functional circuitry.
A device comprising:
- a flip-flop including a primary input, a scan-in input, and a scan-enable input;
- first functional circuitry coupled to the primary input of the flip-flop;
- first test circuitry coupled to the scan-in input of the flip-flop;
- second functional circuitry coupled to the first test circuitry;
- and
- second test circuitry coupled to the first test circuitry and coupled to the scan-enable input of the flip-flop,
- wherein the second test circuitry is configured to cause the first test circuitry to output a first value to the scan-in input of the flip-flop, the first value received from the second functional circuit.
A device comprising:
- a flip-flop including a primary input, a scan-in input, a scan-enable input, and an output;
- first functional circuitry coupled to the primary input of the flip-flop;
- first test circuitry including a first data input, a control input, and an output, wherein the first data input of the first test circuitry is coupled to the output of the flip-flop;
- second functional circuitry coupled to the output of the first test circuitry;
- and
- second test circuitry coupled to the control input of the first test circuitry.
Dependencies are inferred from the claim text.