Method and device for testing applications embedded in electronic systems

A method for testing an application embedded in an electronic system, the electronic system connected, via a first communication bus, to a testing device, the testing device connected to a test computer via a second communication bus, the method comprising:

• first transmitting, by the test computer to the testing device, at least one configuration instruction to transmit at least one second item of data to the electronic system, the at least one configuration instruction comprising at least one selection indication to select the at least one second item of data to be transmitted to the electronic system via the first communication bus;
• and
• second transmitting, by the test computer to the testing device, at least one read instruction to receive, via the second communication bus, at least one representative item of data representative of at least one first item of data received from the electronic system via the first communication bus and/or at least one second item of data transmitted to the electronic system via the first communication bus.