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US 2026/0036620 A1Published application
Test device
AssigneeSiliconware Precision Industries Co., Ltd.
InventorsTien-Yao HSU, Yung-Ming WANG
Life of this patent
Estimating the term…
Abstract
A test device including a test socket and a control module is provided. The test socket has a base and a cover and is used to carry an object to be tested, and the control module is integrated on the test socket and is electrically connected to the test socket and includes a control unit and a memory unit. The test device integrates a test socket and a control module to reduce the attenuation of the analog signal and increase the layout space of the circuit board.
Claims11
A test device for a burn-in test of an object to be tested, comprising:
- a test socket including a base and a cover, and configured for carrying the object to be tested;
- and
- a control module integrated on the test socket and electrically connected to the test socket, and including a control unit and a memory unit.
Dependencies are inferred from the claim text.