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AssigneeBoe Technology Group Co., Ltd.
InventorsNing Zhang, Rui Guan, Lin Fan, Peng Zhao, Jinxiao Wen, Xibo Zhou, Zhuoshi Yang, Xiao Chu
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A data analysis method and apparatus, an electronic device, and a storage medium are provided, which are applicable to the semiconductor display manufacturing field and the artificial intelligence technology field. The data analysis method is applicable to a data analysis platform including at least one data analysis model. The method includes: acquiring a target task for a target product; analyzing target data corresponding to the target task using the at least one data analysis model, and determining a target analysis model from the at least one data analysis model; and in response to a first user completing a parameter adjustment operation on the target analysis model based on the target data, analyzing the target data using the adjusted target analysis model to obtain a target analysis result corresponding to the target task.
A data analysis method, applicable to a data analysis platform comprising at least one data analysis model, wherein the method comprises:
(canceled)
An electronic device, comprising a memory and a processor, wherein the memory stores instructions executable by the processor, and the instructions, when executed by the processor, cause the processor to:
A non-transitory computer-readable storage medium, storing computer instructions configured to cause a computer to:
(canceled)
Dependencies are inferred from the claim text.