Method and system for state estimation based on impedance features
OwnerVenkatesh Kabra, David P. Mageeinventors
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Abstract
A method comprises obtaining a set of impedance values of a first device under test (DUT) across a range of excitation frequencies for a given set of values of a particular state. The method further comprises determining a relationship between the given set of values of the state and the set of impedance values. The method further comprises storing data representing the relationship in a memory, receiving a voltage signal and a current signal from a second DUT, determining an impedance of the second DUT responsive to receiving the voltage and current signals, and determining a value of the state of the second DUT based on the impedance and the data.
Claims30
A method, comprising:
- obtaining a set of impedance values of a first device under test (DUT) across a range of excitation frequencies for a given set of values of a particular state;
- determining a relationship between the given set of values of the state and the set of impedance values;
- storing data representing the relationship in a memory;
- receiving a voltage signal and a current signal from a second DUT;
- determining an impedance of the second DUT responsive to receiving the voltage and current signals;
- and
- determining a value of the state of the second DUT based on the impedance and the data.
A method, comprising:
- obtaining a set of voltage signals and a set of current signals from a device under test (DUT) over a range of excitation frequencies across a set of values of a particular state;
- determining a set of impedance values of the DUT based on the set of voltage signals and the set of current signals;
- determining a relationship between the set of values of the state and the set of impedance values;
- and
- storing data representing the relationship in a memory.
An apparatus comprising:
- a memory configurable to store a first data representing a relationship between a set of values of a state of a first device and a first impedance of the first device across a frequency range;
- and
- a processing circuit having inputs coupled to the memory and an output, the processing circuit configurable to:
- determine a second impedance of a second device across the frequency range;
- receive the first data from the memory;
- receive at least part of the first data responsive to determining the second impedance;
- and
- responsive to receiving the at least part of the first data, determine a state of the second device.
A non-transitory computer readable medium storing instructions that, when executed by a processor circuitry, cause the processor circuitry to:
- obtain a set of impedance values of a first device under test (DUT) across a range of excitation frequencies for a set of values of a particular state;
- determine a relationship between the set of values of the state and the set of impedance values;
- store data representing the relationship in a memory;
- receive a voltage signal and a current signal from a second DUT;
- determine an impedance of the second DUT based on the voltage and current signals;
- and
- determine a value of the state of the DUT based on the impedance and the data.
Dependencies are inferred from the claim text.