Systems and methods for massively parallel trimming of semiconductor devices

An apparatus, comprising:

• a first printed circuit board having a first portion to be enclosed in a thermal chamber, and a second portion to be in ambient room temperature;
• a connector in the first portion to removably couple to a corresponding interface of a second printed circuit board having at least one device under test (DUT) in the thermal chamber;
• and
• electronic circuits in the second portion to execute operations comprising:
• mixing a first analog signal from the DUT and a second analog signal from a local oscillator to generate a first output signal, the first analog signal having an unknown first frequency and the second analog signal having a known second frequency;
• filtering the first output signal through a low pass filter into a second output signal;
• digitizing the second output signal into a plurality of digital signal samples;
• windowing the plurality of digital signal samples within a frequency window;
• computing a discrete spectrum of the plurality of digital signal samples within the frequency window using a Fast Fourier Transform (FFT) algorithm;
• fitting an interpolating function to a plurality of consecutive frequency bins in the discrete spectrum;
• and
• evaluating the unknown first frequency as an apex of the interpolating function.

A system, comprising:

• a thermal chamber;
• a first printed circuit board having a first portion inside the thermal chamber and a second portion outside the thermal chamber;
• a second printed circuit board removably coupled to the first portion of the first printed circuit board, the second printed circuit board being inside the thermal chamber, and having at least one device under test (DUT) affixed thereto;
• and
• a local oscillator outside the thermal chamber conductively coupled to the second portion of the first printed circuit board, wherein:
• the second portion of the first printed circuit board includes electronic circuits to execute operations comprising:
• mixing a first analog signal from the DUT and a second analog signal from the local oscillator to generate a first output signal, the first analog signal having an unknown first frequency and the second analog signal having a known second frequency;
• filtering the first output signal through a low pass filter into a second output signal;
• digitizing the second output signal into a plurality of digital signal samples;
• windowing the plurality of digital signal samples within a frequency window;
• computing a discrete spectrum of the plurality of digital signal samples within the frequency window using a Fast Fourier Transform (FFT) algorithm;
• fitting an interpolating function to a plurality of consecutive frequency bins in the discrete spectrum;
• and
• evaluating the unknown first frequency as an apex of the interpolating function.