Probe and method for manufacturing electrical connection device
AssigneeKabushiki Kaisha Nihon Micronics
InventorsToshinaga TAKEYA, Yasutaka KISHI
Life of this patent
Estimating the term…
Abstract
A probe includes an arm portion with a contact portion at a tip of a free end protruding in a first direction in a cantilever structure; a support portion connected to the arm portion; a joint portion connected to the support portion; and a tension generating section. The tension generating section includes a first end connected to the support portion, and a second end located closer to the contact portion than the first end in the first direction, and that is separated from the support portion. The tension generating section is elastically deformable so that the position of the second end varies in the first direction.
Claims6
A probe used for inspection of an object to be inspected, comprising:
- an arm portion including a fixed end and a free end, with a contact portion at a tip of the free end protruding in a first direction in a cantilever structure;
- a support portion connected to the arm portion at the fixed end;
- a joint portion connected to the support portion in a region where the support portion is separated from a region connected to the fixed end;
- and
- a tension generating section including a first end connected to the support portion, and a second end located closer to the contact portion than the first end in the first direction, and that is separated from the support portion, the tension generating section being elastically deformable so that a position of the second end varies in the first direction.
A method of manufacturing an electrical connection device used for inspection of an object to be inspected, comprising:
- preparing a probe, the probe comprising:
- an arm portion including a fixed end and a free end, with a contact portion at a tip of the free end protruding in a first direction in a cantilever structure,
- a support portion connected to the arm portion at the fixed end,
- a joint portion connected to the support portion in a region where the support portion is separated from a region connected to the fixed end, and
- a tension generating section including a first end connected to the support portion, and a second end located closer to the contact portion than the first end in the first direction, and that is separated from the support portion, the tension generating section being elastically deformable so that the position of the second end varies in the first direction;
- preparing a guide plate in which a through hole is formed, the through hole penetrating from a first main surface to a second main surface facing in a direction opposite to the first main surface;
- inserting the probe into the through hole of the guide plate;
- holding the probe by the guide plate in a state where the joint portion is exposed outside the guide plate and the second end contacts the guide plate;
- and
- joining the joint portion of the probe held by the guide plate to a circuit board.
Dependencies are inferred from the claim text.