Analysis apparatus
AssigneeFUJIFILM Corporation
InventorYoshinobu MIURA
Life of this patent
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AssigneeFUJIFILM Corporation
InventorYoshinobu MIURA
Estimating the term…
An analysis apparatus includes: a support section that supports an analysis chip at a measurement position; a photometry unit including a light-emitting element that irradiates a reaction region of the analysis chip with measurement light, and an area sensor that captures an image of a predetermined imaging range including the irradiated reaction region; a color plate arranged within the imaging range and having a region irradiated with the measurement light; and a processor that performs quantitative analysis of a detection target substance based on a measurement value corresponding to a photometric region brightness value extracted from an image acquired from the photometry unit, and extracts a correction brightness value of the color plate to correct the measurement value based on the correction brightness value and a correlation between a pre-photometric region brightness value acquired in advance using a reference plate, and a pre-correction brightness value of the color plate.
An analysis apparatus comprising:
Dependencies are inferred from the claim text.