Semiconductor structure and manufacturing method thereof
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsTing-Ya LO, HSU-WEI LIU, Cheng-Chin LEE, Shao-Kuan LEE, Hsin-Yen HUANG, Hsiao-Kang CHANG
Life of this patent
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Abstract
A semiconductor structure and a manufacturing method thereof are provided. The manufacturing method of the semiconductor structure includes: forming a sacrificial layer in a concave in a metal layer; recessing the sacrificial layer; filling a metal-organic framework layer in the concave; and removing the sacrificial layer to form an air gap in the concave.
Claims20
A manufacturing method of a semiconductor structure, comprising:
- forming a sacrificial layer in a concave in a metal layer;
- recessing the sacrificial layer;
- filling a metal-organic framework layer in the concave;
- and
- removing the sacrificial layer to form an air gap in the concave.
A semiconductor structure, comprising:
- a metal layer, having a concave;
- a metal-organic framework layer, disposed in the concave;
- and
- an air gap, located in the concave, wherein the air gap is located between the metal-organic framework layer and a bottom of the concave.
A manufacturing method of a semiconductor structure, comprising:
- forming a contact layer in a dielectric layer;
- forming a capping layer on the contact layer;
- forming a glue layer on the dielectric layer and the capping layer;
- forming a metal layer on the glue layer;
- forming a hard mask on the metal layer;
- patterning the hard mask;
- etching the metal layer and the glue layer to form at least one concave;
- forming a dielectric capping layer on a bottom and a lateral wall of the concave;
- forming a sacrificial layer in the concave;
- recessing the sacrificial layer;
- filling a metal-organic framework layer in the concave;
- removing the sacrificial layer to form an air gap in the concave;
- polishing the metal-organic framework layer and the metal layer;
- forming an etching stop layer on the metal-organic framework layer and the metal layer;
- forming a low-k material layer on the etching stop layer;
- patterning the low-k material layer to forming at least one opening exposing part of the metal layer;
- and
- forming a conductive layer in the opening to connect to the metal layer.
Dependencies are inferred from the claim text.