Model training method and system for analyte testing, medium, and device
AssigneeSensura Pte. Ltd
InventorHongzhi ZHENG
Life of this patent
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Abstract
The present invention provides a model training method and system for analyte testing, a medium, and a device which relate to the field of optical analysis. The method includes: data obtaining: obtaining spectral data that indicate uneven distribution of a reflection signal or an excitation signal generated by an analyte when irradiated by light, and obtaining a true test result of the analyte in a same time period; and model training: using the obtained spectral data as an input of the testing model, using the true test result as an output of the testing model, and training the testing model. According to this application, the obtained spectral data can be prevented from being affected by the influence of a non-analyte, improving the accuracy of the testing model.
Claims15
A model training method for analyte testing, comprising:
- data obtaining step:
- obtaining spectral data that indicate uneven distribution of a reflection signal or an excitation signal generated by an analyte when irradiated by light, and obtaining a true test result of the analyte in a same time period;
- and
- model training step:
- using the obtained spectral data as an input of the testing model, using the true test result as an output of the testing model, and training the testing model.
A model training system for analyte testing, comprising:
- a data obtaining module, configured to obtain spectral data that indicate uneven distribution of a reflection signal or an excitation signal generated by an analyte when irradiated by light, and obtain a true test result of the analyte in a same time period;
- and
- a model training module, configured to use the obtained spectral data as an input of the testing model, use the true test result as an output of the testing model, and train the testing model.
Dependencies are inferred from the claim text.